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NanoScience and Technology: Atomic Force Microscopy

Second Edition

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The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.

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NanoScience and Technology: Atomic Force Microscopy, Bert Voigtländer

Sprache
Erscheinungsdatum
2019
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Titel
NanoScience and Technology: Atomic Force Microscopy
Untertitel
Second Edition
Sprache
Englisch
Verlag
Springer
Erscheinungsdatum
2019
Einband
Hardcover
Seitenzahl
345
ISBN10
3030136531
ISBN13
9783030136536
Reihe
Bewertung
5 von 5 Sternen
Beschreibung
The book explains the operating principles of atomic force microscopy to enable readers to operate a scanning probe microscope successfully and to understand the data obtained. The chapters on the scanning probe techniques are complemented by chapters on fundamentals and important technical aspects. This book is primarily intended for graduate students in physics, materials science, chemistry, nanoscience and engineering, as well as researchers new to the field.