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The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e. g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.
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Positron annihilation in semiconductors, Reinhard Krause-Rehberg
- Sprache
- Erscheinungsdatum
- 1999
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- Titel
- Positron annihilation in semiconductors
- Sprache
- Englisch
- Autor*innen
- Reinhard Krause-Rehberg
- Verlag
- Springer
- Erscheinungsdatum
- 1999
- ISBN10
- 3540643710
- ISBN13
- 9783540643715
- Kategorie
- Physik
- Beschreibung
- The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e. g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.