Positron annihilation in semiconductors

Autor*innen

• Reinhard Krause-Rehberg

Parameter

• 379 Seiten
• 14 Lesestunden

• Naturwissenschaften
• Physik

Mehr zum Buch

The subject of this book is the investigation of lattice imperfections in semiconductors by means of positron annihilation. A comprehensive review is given of the different positron techniques, whose application to various kinds of defects, e. g. vacancies, impurity-vacancy complexes and dislocations, is described. The sensitivity range of positron annihilation with respect to the detection of these defects is compared to that of other defect-sensitive methods. The most prominent results obtained with positrons in practically all important semiconductors are reviewed. A special chapter of the book deals with positron annihilation as a promising tool for many technological purposes. The theoretical background necessary to understand the experimental results is explained in detail.

• Sprache: Englisch
• Erscheinungsdatum: 1999
• Einband: Hardcover