Lock-in Thermography

Basics and Use for Evaluating Electronic Devices and Materials

Autor*innen

• Wilhelm Warta
• Otwin Breitenstein
• Martin Langenkamp

Parameter

• Architektur & Städtebau
• Bauwesen & Statik
• Hobby & Freizeit

Mehr zum Buch

"Lock-in Thermography" delves into advanced infrared measurement systems for analyzing electronic materials, particularly solar cells. The updated edition covers new techniques like Illuminated Lock-In Thermography and Carrier Density Imaging, enhancing spatial resolution and providing innovative timing strategies for improved analysis.

• Sprache: Englisch
• Erscheinungsdatum: 2010