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Surface Microscopy with Low Energy Electrons

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Seitenzahl
516 Seiten
Lesezeit
19 Stunden

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Focusing on advanced imaging techniques, this book delves into surface physics and thin film research, highlighting methods utilizing low energy electrons. It provides in-depth coverage of innovative techniques such as Low Energy Electron Microscopy (LEEM), Spin-Polarized Low Energy Electron Microscopy (SPLEEM), and Photoemission Electron Microscopy (PEEM), among others. The author, a pioneer in the field, presents fundamental principles, experimental setups, and practical applications, complemented by numerous illustrations to enhance understanding of electron optics and results.

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Surface Microscopy with Low Energy Electrons, Erns W. Bauer

Sprache
Erscheinungsdatum
2014
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