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Fundamentals of Electromigration-Aware Integrated Circuit Design

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Seitenzahl: 176 Seiten
Lesezeit: 7 Stunden

Informatik & Programmierung

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Focusing on electromigration, the book explores its impact on the reliability of electronic circuits. It details the physical processes involved, equipping readers with the knowledge needed to implement effective countermeasures. A variety of strategies for adapting current integrated circuit design methodologies to mitigate electromigration are presented. Additionally, the authors demonstrate how certain effects can be harnessed in existing and emerging technologies to minimize the detrimental effects on circuit reliability.

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Fundamentals of Electromigration-Aware Integrated Circuit Design, Jens Lienig, Matthias Thiele

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Erscheinungsdatum: 2018
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Titel: Fundamentals of Electromigration-Aware Integrated Circuit Design
Sprache: Englisch
Autor*innen: Jens Lienig, Matthias Thiele
Verlag: Springer International Publishing
Erscheinungsdatum: 2018
Einband: Paperback
Seitenzahl: 176
ISBN13: 9783030088118
Schlagwörter: Informatik & Programmierung
Beschreibung: Focusing on electromigration, the book explores its impact on the reliability of electronic circuits. It details the physical processes involved, equipping readers with the knowledge needed to implement effective countermeasures. A variety of strategies for adapting current integrated circuit design methodologies to mitigate electromigration are presented. Additionally, the authors demonstrate how certain effects can be harnessed in existing and emerging technologies to minimize the detrimental effects on circuit reliability.