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Fundamentals of Electromigration-Aware Integrated Circuit Design

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Seitenzahl: 176 Seiten
Lesezeit: 7 Stunden

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Focusing on the physical process of electromigration, this book delves into its impact on electronic circuit reliability. It offers insights into effective countermeasures and presents a range of modifications to current integrated circuit design methodologies aimed at preventing electromigration. Additionally, the authors explore ways to leverage specific effects in both current and future technologies to mitigate the adverse effects of electromigration, enhancing circuit reliability and performance.

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Fundamentals of Electromigration-Aware Integrated Circuit Design, Jens Lienig, Matthias Thiele

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Erscheinungsdatum: 2018
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Titel: Fundamentals of Electromigration-Aware Integrated Circuit Design
Sprache: Englisch
Autor*innen: Jens Lienig, Matthias Thiele
Verlag: Springer International Publishing
Erscheinungsdatum: 2018
Einband: Hardcover
Seitenzahl: 176
ISBN13: 9783319735573
Schlagwörter: Informatik & Programmierung
Beschreibung: Focusing on the physical process of electromigration, this book delves into its impact on electronic circuit reliability. It offers insights into effective countermeasures and presents a range of modifications to current integrated circuit design methodologies aimed at preventing electromigration. Additionally, the authors explore ways to leverage specific effects in both current and future technologies to mitigate the adverse effects of electromigration, enhancing circuit reliability and performance.