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Surface and Thin Film Analysis

A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition

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Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.

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Surface and Thin Film Analysis, Gernot Friedbacher, Henning Bubert

Sprache
Erscheinungsdatum
2011
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(Hardcover)
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Titel
Surface and Thin Film Analysis
Untertitel
A Compendium of Principles, Instrumentation, and Applications - Second, Completely Revised and Enlarged Edition
Sprache
Englisch
Verlag
Wiley-VCH
Erscheinungsdatum
2011
Einband
Hardcover
Seitenzahl
558
ISBN10
3527320474
ISBN13
9783527320479
Reihe
Beschreibung
Surveying and comparing all techniques relevant for practical applications, this second edition of a bestseller is a vital guide to this hot topic in nano- and surface technology. Completely revised and updated, sections include electron, ion and photon detection, as well as scanning microscopy, while new chapters have been added to cover such recently developed techniques as SNOM, SERS, and laser ablation. Over 500 references and a list of equipment suppliers make this a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry.